Guest Editor, Special Issue on Verification, Test,Diagnosis for VLSI Systems, IEICE Trans. on Information and Systems,IEICE Japan, May 1992 - March 1995
Chair, Technical Group on Fault Tolerant Systems, IEICE Japan, May 1995 - May 1997
Guest Editor, Special Issue on Test Technology, IEICE Trans. (D-I) (in Japanese), IEICE Japan, Oct. 1995 - Dec. 1996
Member, Technical Group on Fault Tolerant Systems/Dependable Computing, IEICE Japan, May 1997 - May 2006
Associate Editor, IEEE Transactions on Computers, May 1998 - May 2002
Chair, IEEE ATS (Asian Test Symposium) Steering Committee, January 2001 - Dec. 2004
Chair, IEEE WRTLT (Workshop on RTL and High Level Testing) Steering Committee, Nov. 2003 - Dec. 2006
Board Member of IEEE Kansai Section (in Japan, Region 10), Jan. 2003 - Dec. 2008